CRAY X-MP上の表面電荷法と電子軌道計算

Abstract

The surface charge method (SCM) is the precise electric field solver utilized for the numerical analysis of the electron optical devices, such as electron guns and lenses. Because of its long computing time, the SCM brings a serious problem when a large number of electron trajectories have to be calculated for the analysis. This paper describes the SCM and the electron ray tracing on the vector pipeline supercomputer CRAY X-MP/14se. The SCM-code was optimized for the parallel computation, and the effect on the ray tracing time was examined. The method and result are presented.